XRF(X-ray Fluorescence)

	Model	S4 PIONEER(BRUKER)
	Characteristic	X-rays are irradiated on the sample to detect the elements contained in the unknown sample. Analysis of components without deformation of the sample Rapid analysis of unknown components
	Apply	Analysis of iron and non-ferrous materials, analysis of minerals and raw materials Component analysis of electronic parts and materials.

AAS(Atomic adsorption spectrometer)

	Model	AA240FS(Varian)
	Characteristic	Detection of element by absorbing light generated by atomization of sample. Trace detection up to ppm level can be used to quantify trace metals in samples.
	Apply	Quantitative Analysis of Impurities in High Purity Metals Quantitative analysis of over 60 elements including trace analysis of samples.

ICP(Induction Coupled Plasma)

	Model	ICPS-1000IV(Shimadzu)
	Characteristic	The sample is irradiated with a plasma, and the generated radiation is detected to analyze trace elements.
	Apply	Analysis of the various elements contained in the sample Detection of trace metals in the industry such as semiconductors, metals, ceramics, etc. Analysis of composition of alloy, petrochemical, and polymer chemistry related products.

Titration

	Characteristic	Rapid and accurate quantitative method to find end point by titrating specific elements Unlike AAS or ICP, high-quality sample quantitative analysis of analytical element.
	Apply	Ag paste of silver paste and process sludge Quantitative analysis of Sn and Ag of slag, etc. of waste solder Quantitative analysis of cobalt of ore and secondary total cost.